XR Twin Set

Centreline Thickness & Profile Measuring System

Centreline Thickness & Profile Measuring System

The XR Twin Set centreline thickness and profile measuring system detects both strip thickness in the centre of the roller table and the strip thickness cross profile by means of continuous, non-contact, real-time measurement. This is achieved with two separate c-frames combined constructively to form one measuring system.

The upper beam of the C-frame for the XR thickness measurement and profile measurement contains a task-based number of ionisation chambers to receive the radiation emitted by the x-ray tube installed in the lower beam and which passes through the material.

This residual radiation, which is dependent on the thickness of the material, is converted in the ionisation chambers into electrical signals, which are then used to determine and record the exact thickness of the material.

Gauge 1: Thickness measurement in the centre of the roller table

Gauge 2: Continuous measurement of the strip thick-ness cross profile by traversing over the entire strip width

Special Features

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XR Twin Set

Centreline Thickness & Profile Measuring System

Centreline Thickness & Profile Measuring System

Technical Information

Material data

Typical thickness range:

> 0 mm up to 80 mm

Speed:

> 0 – 12 m/s

Width:

up to 3,000 mm

Measurement system data

Gauge type:

movable c-frame

Radiation source:

X-ray tube (approx. 110 kV/ 2.5 mA, depending on the measuring task)

Measuring dynamics

Analogue time constant:

approx. 10 ms

Cycle time data processing:

10 ms

Cycle time data output CL:

10 ms

Cycle time data output profile:

after full cross profile scan (depending on strip width)

Measuring accuracy

Reproducibility:

≤ 0.07%

Linearity:

≤ 0.05%

Long term drift (10 hrs):

≤ 0.1%

Statistical noise (10 ms):

≤ 0.1 %

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